Course Highlights :-

  • 1 Dedicated Mentor
  • Support24/7 Tool Access
  • Multiple MOCK Interviews
  • Industry Standard Projects
  • Resume Preparation

Eligibility Criteria :-

  • B.E/B.Tech in ECE/EEE.
  • M.E/M.Tech/M.S in VLSI/Embedded Systems/Digital Electronics.
  • 60% through out Academics

Course Duration :-

  • 4-6 Months

JTAG and Scan Insertion

WEEK -1

  • Full ASIC flow – DFT
  • DFT Basics
  • Boundary scan / JTAG basics
  • Boundary scan cell operation in detail
  • JTAG operation
  • TAP controller state machine

WEEK -2

  • Understanding of SCAN in depth
  • Types of Scan architecture
  • Scan architecture overview

WEEK -3

  • Test cases assignments review
  • Assessment on Boundary scan

WEEK -4

  • Scan design rules
  • Design Rule Checking (DRC)
  • DRC Fixing with examples

WEEK -5

  • Full scan insertion and stitching without compression
  • Multiple clock domains in SoC
  • Handling multiple clock domains during shift and capture

WEEK -6

  • Basics and Need of Compression
  • Compression techniques
  • Scan insertion with compression
  • On-chip clocking for at-speed testing
  • Hierarchical Scan Design

WEEK -7

  • Test cases assignments review
  • Assessment on Scan Insertion

ATPG and Simulations

WEEK -1

  • DFT Overview – ATPG
  • Understanding of Defects and Faults
  • Types of fault models
  • Basic concepts of ATPG
  • ATPG algorithm
  • Different types of ATPG

WEEK -2

  • Stuck-at fault model (In detail)
  • Understanding of ATPG constraints
  • ATPG DRC analysis
  • ATPG for Stuck-at fault model
  • Coverage improvement techniques
WEEK -3

  • At speed fault model (In detail)
  • Understanding Transition fault ATPG
  • ATPG setup for transition fault model
  • ATPG for Transition fault model

WEEK -4

  • Introduction to Diagnosis
  • Diagnosis Flow
  • Analyzing failure logs
  • Chain Failure Diagnosis
  • Successful results

WEEK -5

  • Test cases assignments review
  • Assessment on ATPG & Simulations

WEEK -6

  • Preparation for Interviews & guidance